Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling
| Autor: | Desplats, R., Eral, A., Beaudoin, F., Perdu, P., Weger, A., McManus, M., Song, P., Stellari, F. |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1663-1668 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect