Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels –An explanation and die protection strategy
| Autor: | Sowariraj, M.S.B., Smedes, Theo, Salm, Cora, Mouthaan, Ton, Kuper, Fred G |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1569-1575 |
| Databáze: | ScienceDirect |
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