Dependence of Post-Breakdown Conduction on Gate Oxide Thickness
| Autor: | Lombardo, S., Stathis, J.H., Linder, B.P. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2002 42(9):1481-1484 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Lombardo, S., Stathis, J.H., Linder, B.P. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2002 42(9):1481-1484 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect