Use of electrical stress and isochronal annealing on power MOSFETs in order to characterize the effects of 60Co irradiation
| Autor: | Picard, C., Brisset, C., Hoffmann, A., Charles, J.-P., Joffre, F., Adams, L., Holmes Siedle, A. |
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| Zdroj: | In Microelectronics Reliability August-October 2000 40(8-10):1647-1652 |
| Databáze: | ScienceDirect |
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