Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults
| Autor: | Metra, C. ∗, Di Francescantonio, S., Favalli, M., Riccò, B. |
|---|---|
| Zdroj: | In Microelectronics Journal 1 January 2003 34(1):23-29 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect