Dynamic stressing of thin tunnel oxides: a way to emulate a single EEPROM cell programming function
| Autor: | Plossu, C a, *, Voisin, J.M a, Bos, B a, Raynaud, C a, Bouchakour, R b, Boivin, P c, Balland, B a |
|---|---|
| Zdroj: | In Journal of Non-Crystalline Solids 1999 245(1):85-91 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect