Conduction properties of electrically erasable read only memory tunnel oxides under dynamic stress
| Autor: | Plossu, C. *, Croci, S., Monti, N., Bouchakour, R., Laffont, R., Boivin, Ph., Mirabel, J.M. |
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| Zdroj: | In Journal of Non-Crystalline Solids 2001 280(1):103-109 |
| Databáze: | ScienceDirect |
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