Annealing behavior and electrical properties of atomic layer deposited PbTiO3 and PZT films

Autor: Yang, Jung In, Welsh, Aaron, Sbrockey, Nick M., Tompa, Gary S., Polcawich, Ronald G., Potrepka, Daniel M., Trolier-McKinstry, Susan
Zdroj: In Journal of Crystal Growth 1 July 2018 493:45-50
Databáze: ScienceDirect