Formation of interfacial misfit dislocation in GaSb/GaAs heteroepitaxy via anion exchange process

Autor: Tan, K.H., Jia, B.W., Loke, W.K., Wicaksono, S., Yoon, S.F.
Zdroj: In Journal of Crystal Growth 1 October 2015 427:80-86
Databáze: ScienceDirect