Microstructural characterization of very thick freestanding 3C-SiC wafers
| Autor: | Polychroniadis, E., Syväjärvi, M., Yakimova, R., Stoemenos, J. * |
|---|---|
| Zdroj: | In Journal of Crystal Growth 1 March 2004 263(1-4):68-75 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Polychroniadis, E., Syväjärvi, M., Yakimova, R., Stoemenos, J. * |
|---|---|
| Zdroj: | In Journal of Crystal Growth 1 March 2004 263(1-4):68-75 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect