Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy
| Autor: | Pham, Van Dong, González, César, Dappe, Yannick J., Dong, Chengye, Robinson, Joshua A., Trampert, Achim, Engel-Herbert, Roman |
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| Zdroj: | In Carbon 30 June 2024 227 |
| Databáze: | ScienceDirect |
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