Reliability of computer memories in radiation environment

Autor:	Fetahović Irfan S., Dolićanin Edin Ć., Lončar Boris B., Kartalović Nenad M.
Jazyk:	angličtina
Rok vydání:	2016
Předmět:	magnetic memory semiconductor memory radioactive reliability gamma radiation neutron radiation Nuclear and particle physics. Atomic energy. Radioactivity QC770-798
Zdroj:	Nuclear Technology and Radiation Protection, Vol 31, Iss 3, Pp 240-246 (2016)
Druh dokumentu:	article
ISSN:	1451-3994 1452-8185
DOI:	10.2298/NTRP1603240F
Popis:	The aim of this paper is examining a radiation hardness of the magnetic (Toshiba MK4007 GAL) and semiconductor (AT 27C010 EPROM and AT 28C010 EEPROM) computer memories in the field of radiation. Magnetic memories have been examined in the field of neutron radiation, and semiconductor memories in the field of gamma radiation. The obtained results have shown a high radiation hardness of magnetic memories. On the other side, it has been shown that semiconductor memories are significantly more sensitive and a radiation can lead to an important damage of their functionality. [Projekat Ministarstva nauke Republike Srbije, br. 171007]
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/83df6f9915374014912ba6ed207f2f7a Zobrazit plný text záznamu View record in DOAJ