Autor: |
Yang Xu, Lei Pang, Tianxi Xie, Zhengguang Chen, Jun Guo |
Jazyk: |
angličtina |
Rok vydání: |
2024 |
Předmět: |
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Zdroj: |
Scientific Reports, Vol 14, Iss 1, Pp 1-12 (2024) |
Druh dokumentu: |
article |
ISSN: |
2045-2322 |
DOI: |
10.1038/s41598-024-77351-4 |
Popis: |
Abstract The long-term operation performance of HVDC transmission systems is significantly influenced by the reliability of thyristors. However, the current reliability research of thyristors is mainly based on the leakage current and there is no comprehensive degradation characteristics of thyristors. In this article, the degradation characteristics of thyristors under voltage and temperature accelerated ageing tests are obtained, including the reverse recovery characteristic, on-state characteristic, blocking characteristic and gate characteristic. The reverse recovery characteristic obviously degrades under the voltage accelerated ageing tests. The reverse recovery charge and reverse recovery time decrease by over 10% after the tests. Seven thyristors operating for a certain number of years from two HVDC stations are tested, and the results verify the thyristor degradation characteristics obtained from the ageing tests. Moreover, the mechanisms of the leakage current and reverse recovery characteristic are analyzed in detail. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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