| Autor: |
Hechuan Ma, Xiaoming Chen, Yufei Han, Jie Zhang, Kaiqiang Wen, Siyi Cheng, Quanyi Zhao, Yijie Wang, Jianyang Wu, Jinyou Shao |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
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| Zdroj: |
Advanced Science, Vol 11, Iss 32, Pp n/a-n/a (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2198-3844 |
| DOI: |
10.1002/advs.202402319 |
| Popis: |
Abstract Graphene films grown by the chemical vapor deposition (CVD) method suffer from contamination and damage during transfer. Herein, an innovative ice‐enabled transfer method under an applied electric field and in the presence of Cu2O (or Cu2O‐Electric‐field Ice Transfer, abbreviated as CEIT) is developed. Ice serves as a pollution‐free transfer medium while water molecules under the electric field fully wet the graphene surface for a bolstered adhesion force between the ice and graphene. Cu2O is used to reduce the adhesion force between graphene and copper. The combined methodology in CEIT ensures complete separation and clean transfer of graphene, resulting in successfully transferred graphene to various substrates, including polydimethylsiloxane (PDMS), Teflon, and C4F8 without pollution. The graphene obtained via CEIT is utilized to fabricate field‐effect transistors with electrical performances comparable to that of intrinsic graphene characterized by small Dirac points and high carrier mobility. The carrier mobility of the transferred graphene reaches 9090 cm2 V−1 s−1, demonstrating a superior carrier mobility over that from other dry transfer methods. In a nutshell, the proposed clean and efficient transfer method holds great potential for future applications of graphene. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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