CD 150 - short wheat cultivar with high quality and high yield

Autor: Ivan Schuster, Edson Feliciano de Oliveira, Tatiane Dalla Nora, Volmir Sergio Marchioro, Francisco de Assis Franco, Elisa Serra Negra Vieira, Ademar Alves Sobrinho, Adriel Evangelista
Jazyk: angličtina
Rok vydání: 2011
Předmět:
Zdroj: Crop Breeding and Applied Biotechnology, Vol 11, Iss 2, Pp 186-188 (2011)
Druh dokumentu: article
ISSN: 1518-7853
1984-7033
Popis: The industrial quality and lodging resistance of CD 150, a cross between CD104 and CD108, are high and the plant heightis short. The average yield was 10 % higher than of the controls in the regions II, III and IV. It is suitable for cultivation in the states of PR,SP, MS and GO, MG, and DF.
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