| Autor: |
Guo Chao-Heng, Tang Guo-Jing, Li Meng-Yu, Chen Wen-Jie, He Xin-Tao, Dong Jian-Wen |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
Nanophotonics, Vol 13, Iss 8, Pp 1387-1395 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2192-8614 |
| DOI: |
10.1515/nanoph-2023-0727 |
| Popis: |
Sharp-bending waveguide is a key element for ultra-compact and densely integrated photonic devices, which is promising to enlarge the capability of modern information processing in a single chip. Topological photonics manifest the nature of robust propagation against sharp bending and such robustness has been experimentally demonstrated in topological integrated interfaces. It is important to quantify the bending loss of topological interface but has remained exclusive. In this work, we report on the characterization of sharp-bending robustness in the integrated topological interface of valley photonic crystals (VPCs) by experimentally quantifying the ultralow bending loss. The VPCs are designed on a standard silicon-on-insulator platform with the inversion-symmetry broken in honeycomb lattice, and four types of topological interfaces can be constructed by two topologically-distinct VPCs. As one of the representative cases, zigzag-AA interface is applied to demonstrate the robust propagation along sharp bending. In experiment, we fabricate a series of VPC interfaces with different turn number and the same transmission distance, which perform the ultralow bending loss less than 0.02 dB per 120-deg turning. Furthermore, we experimentally characterize the propagation loss in the integrated interfaces. Our approach not only shows the ability of VPC topological interfaces to suppress backscattering stemming from sharp bending, but also paves the way for topological nanophotonic dense integration. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
|
