| Autor: |
S. Yu. Volkov, V. L. Liaskovskii, E. M. Kholodova |
| Jazyk: |
ruština |
| Rok vydání: |
2017 |
| Předmět: |
|
| Zdroj: |
Standartnye Obrazcy, Vol 0, Iss 4, Pp 25-30 (2017) |
| Druh dokumentu: |
article |
| ISSN: |
2077-1177 |
| Popis: |
Development of the nano industry and emergence of new product types manufactured with the use of nanotechnologies raises an issue of accurate measurement of unique nano material parameters. One of the main conditions for metrological assurance of innovative nano productsis existence of a professional labour market providing specialists with knowledge and skills pertaining to nano material studies, production technology, control of nano materials and nano objects in the technological process and products, as well as pertaining to the formation of normative and methodological documents regulating the frame work of metrological assurance at the enterprise. The present paperis devotedto the description of main provisions outlined in the draft professional standard "A metrology specialist in the nano industry" |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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