Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Autor: S. Kravitz, R. J. Smith, L. Hagaman, E. P. Bernard, D. N. McKinsey, L. Rudd, L. Tvrznikova, G. D. Orebi Gann, M. Sakai
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: European Physical Journal C: Particles and Fields, Vol 80, Iss 3, Pp 1-20 (2020)
Druh dokumentu: article
ISSN: 1434-6044
1434-6052
DOI: 10.1140/epjc/s10052-020-7800-6
Popis: Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.
Databáze: Directory of Open Access Journals
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