Low-Loss Singlemode PECVD Silicon Nitride Photonic Wire Waveguides for 532–900 nm Wavelength Window Fabricated Within a CMOS Pilot Line

Autor: A. Z. Subramanian, P. Neutens, A. Dhakal, R. Jansen, T. Claes, X. Rottenberg, F. Peyskens, S. Selvaraja, P. Helin, B. DuBois, K. Leyssens, S. Severi, P. Deshpande, R. Baets, P. Van Dorpe
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: IEEE Photonics Journal, Vol 5, Iss 6, Pp 2202809-2202809 (2013)
Druh dokumentu: article
ISSN: 1943-0655
DOI: 10.1109/JPHOT.2013.2292698
Popis: PECVD silicon nitride photonic wire waveguides have been fabricated in a CMOS pilot line. Both clad and unclad single mode wire waveguides were measured at λ = 532, 780, and 900 nm, respectively. The dependence of loss on wire width, wavelength, and cladding is discussed in detail. Cladded multimode and singlemode waveguides show a loss well below 1 dB/cm in the 532-900 nm wavelength range. For singlemode unclad waveguides, losses 1 dB/cm were achieved at λ = 900 nm, whereas losses were measured in the range of 1-3 dB/cm for λ = 780 and 532 nm, respectively.
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