Optical properties of SrxBa1−xNb2O6 nanoscale films (x = 0.5 and 0.61) grown by RF-cathode sputtering in an oxygen atmosphere
| Autor: | S. V. Kara-Murza, K. M. Zhidel, N. V. Korchikova, Yu. V. Tekhtelev, A. V. Pavlenko, L. I. Kiseleva |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: | |
| Zdroj: | Journal of Advanced Dielectrics, Vol 11, Iss 5, Pp 2160014-1-2160014-6 (2021) |
| Druh dokumentu: | article |
| ISSN: | 2010-135X 2010-1368 2010135X |
| DOI: | 10.1142/S2010135X21600146 |
| Popis: | The research findings of the phase composition, nanostructure and optical properties of strontium–barium niobate thin films are discussed. SrxBa1−xNb2O6 nanosized films (x = 0.5 and 0.61) were characterized by XRD, SEM and AFM studies. Reflective multi-angle ellipsometry and spectrophotometry were used to determine the optical parameters (refractive index, its dispersion, and thickness of the damaged surface layer) of thin films. It was shown that SBN-50 and SBN-61 thin films were grown c-oriented on Al2O3 (0001) and heteroepitaxial on MgO (001) substrates. The increase of refractive index, approaching its maximum value in the bulk material for a given composition as the film thickness increases, is observed. |
| Databáze: | Directory of Open Access Journals |
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