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This paper introduces an improved methodology designed to address a practical deficit of existing methodologies by incorporating circuit-level analysis in the assessment of building microgrid reliability. The scientific problem at hand involves devising a systematic approach that integrates circuit modeling, Probability Density Function (PDF) selection, formulation of reliability functions, and Fault Tree Analysis (FTA) tailored specifically for the distinctive features of building microgrids. This method entails analyzing inter-component relationships to gain comprehensive insights into system behavior. By harnessing the circuit models and theoretical framework proposed herein, precise estimations of microgrid failure rates can be attained. To complement this approach, we propose a thorough investigation utilizing reliability curves and importance measures, providing valuable insights into individual device failure probabilities over time. Such time-based analysis plays a crucial role in proactively identifying potential failures and facilitating efficient maintenance planning for microgrid devices. We demonstrate the application of this methodology to the University of Antioquia (UdeA) Microgrid, a low-voltage system comprising critical components such as solar panels, microinverters, inverters/chargers, batteries, and charge controllers. |
