Autor: |
Debevc, J., Franks, M., Hiti, B., Kraemer, U., Kramberger, G., Mandić, I., Marco-Hernández, R., Nobels, D. J. L., Powell, S., Sonneveld, J., Steininger, H., Tsolanta, C., Vilella, E., Zhang, C. |
Rok vydání: |
2023 |
Předmět: |
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Druh dokumentu: |
Working Paper |
DOI: |
10.1088/1748-0221/19/05/P05068 |
Popis: |
Results in this paper present an in-depth study of time resolution for active pixels of the RD50-MPW2 prototype CMOS particle detector. Measurement techniques employed include Backside- and Edge-TCT configurations, in addition to electrons from a $^{90}\mathrm{Sr}$ source. A sample irradiated to $5\cdot 10^{14}\,\mathrm{n}_\mathrm{eq}/\mathrm{cm}^2$ was used to study the effect of radiation damage. Timing performance was evaluated for the entire pixel matrix and with positional sensitivity within individual pixels as a function of the deposited charge. Time resolution obtained with TCT is seen to be uniform throughout the pixel's central region with approx. $220\,\mathrm{ps}$ at $12\,\mathrm{ke}^-$ of deposited charge, degrading at the edges and lower values of deposited charge. $^{90}\mathrm{Sr}$ measurements show a slightly worse time resolution as a result of delayed events coming from the peripheral areas of the pixel. |
Databáze: |
arXiv |
Externí odkaz: |
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