| Autor: |
McRae, C. R. H., Lake, R. E., Long, J. L., Bal, M., Wu, X., Jugdersuren, B., Metcalf, T. H., Liu, X., Pappas, D. P. |
| Rok vydání: |
2019 |
| Předmět: |
|
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1063/5.0004622 |
| Popis: |
The investigation of two-level-state (TLS) loss in dielectric materials and interfaces remains at the forefront of materials research in superconducting quantum circuits. We demonstrate a method of TLS loss extraction of a thin film dielectric by measuring a lumped element resonator fabricated from a superconductor-dielectric-superconductor trilayer. We extract the dielectric loss by formulating a circuit model for a lumped element resonator with TLS loss and then fitting to this model using measurements from a set of three resonator designs: a coplanar waveguide resonator, a lumped element resonator with an interdigitated capacitor, and a lumped element resonator with a parallel plate capacitor that includes the dielectric thin film of interest. Unlike other methods, this allows accurate measurement of materials with TLS loss lower than $10^{-6}$. We demonstrate this method by extracting a TLS loss of $1.02 \times 10^{-3}$ for sputtered $\mathrm{Al_2O_3}$ using a set of samples fabricated from an $\mathrm{Al/Al_2O_3/Al}$ trilayer. We observe a difference of 11$\%$ between extracted loss of the trilayer with and without the implementation of this method. |
| Databáze: |
arXiv |
| Externí odkaz: |
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