| Autor: |
Brun, B., Martins, F., Faniel, S., Hackens, B., Cavanna, A., Ulysse, C., Ouerghi, A., Gennser, U., Mailly, D., Simon, P., Huant, S., Bayot, V., Sanquer, M., Sellier, H. |
| Rok vydání: |
2016 |
| Předmět: |
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| Zdroj: |
Physical Review Letters 116, 136801 (2016) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1103/PhysRevLett.116.136801 |
| Popis: |
The Kondo effect is the many-body screening of a local spin by a cloud of electrons at very low temperature. It has been proposed as an explanation of the zero-bias anomaly in quantum point contacts where interactions drive a spontaneous charge localization. However, the Kondo origin of this anomaly remains under debate, and additional experimental evidence is necessary. Here we report on the first phase-sensitive measurement of the zero-bias anomaly in quantum point contacts using a scanning gate microscope to create an electronic interferometer. We observe an abrupt shift of the interference fringes by half a period in the bias range of the zero-bias anomaly, a behavior which cannot be reproduced by single-particle models. We instead relate it to the phase shift experienced by electrons scattering off a Kondo system. Our experiment therefore provides new evidence of this many-body effect in quantum point contacts. |
| Databáze: |
arXiv |
| Externí odkaz: |
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