Second harmonic microscopy of monolayer MoS2

Autor:	Kumar, Nardeep, Najmaei, Sina, Cui, Qiannan, Ceballos, Frank, Ajayan, Pulickel M., Lou, Jun, Zhao, Hui
Rok vydání:	2013
Předmět:	Condensed Matter - Materials Science Condensed Matter - Mesoscale and Nanoscale Physics Physics - Optics
Zdroj:	Phys. Rev. B 87, 161403(R) (2013)
Druh dokumentu:	Working Paper
DOI:	10.1103/PhysRevB.87.161403
Popis:	We show that the lack of inversion symmetry in monolayer MoS2 allows strong optical second harmonic generation. Second harmonic of an 810-nm pulse is generated in a mechanically exfoliated monolayer, with a nonlinear susceptibility on the order of 1E-7 m/V. The susceptibility reduces by a factor of seven in trilayers, and by about two orders of magnitude in even layers. A proof-of-principle second harmonic microscopy measurement is performed on samples grown by chemical vapor deposition, which illustrates potential applications of this effect in fast and non-invasive detection of crystalline orientation, thickness uniformity, layer stacking, and single-crystal domain size of atomically thin films of MoS2 and similar materials. Comment: 6 pages, 4 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1302.3935 Zobrazit plný text záznamu View this record from Arxiv