Analysing surface structures on (Ga,Mn)As by Atomic Force Microscopy
Autor: | Piano, S., Rushforth, A. W., Edmonds, K. W., Campion, R. P., Adesso, G., Gallagher, B. L. |
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Rok vydání: | 2011 |
Předmět: | |
Zdroj: | Journal of Nanoscience and Nanotechnology, Volume 12, Number 9, September 2012 , pp. 7545-7549(5) |
Druh dokumentu: | Working Paper |
DOI: | 10.1166/jnn.2012.6553 |
Popis: | Using atomic force microscopy, we have studied the surface structures of high quality molecular beam epitaxy grown (Ga,Mn)As compound. Several samples with different thickness and Mn concentration, as well as a few (Ga,Mn)(As,P) samples have been investigated. All these samples have shown the presence of periodic ripples aligned along the $[1\bar{1}0]$ direction. From a detailed Fourier analysis we have estimated the period (~50 nm) and the amplitude of these structures. Comment: 5 pages, 2 figures, 2 tables. To appear in J. Nanosci. Nanotechnol. (special issue for the RTNSA conference 2011) |
Databáze: | arXiv |
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