Pseudo-Ring Testing Schemes and Algorithms of RAM Built-In and Embedded Self-Testing
| Autor: | Bodean, Diana, Bodean, Ghenadie, Gharibi, Wajeb |
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| Rok vydání: | 2011 |
| Předmět: | |
| Zdroj: | 14 th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 13-15, 2011, Cottbus, Germany |
| Druh dokumentu: | Working Paper |
| Popis: | Scan and ring schemes of the pseudo-ring memory selftesting are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional logic is required and allows microcontrollers at-speed testing. Also, in this article,are given the a posteriori values of some type of memories faults coverage when pseudo-ring testing schemes are applied. Comment: 4 pages |
| Databáze: | arXiv |
| Externí odkaz: |
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