Precise Half-Life Measurement of the Superallowed Beta+ Emitter 26Si

Autor: Iacob, V. E., Hardy, J. C., Banu, A., Chen, L., Golovko, V. V., Goodwin, J., Horvat, V., Nica, N., Park, H. I., Trache, L., Tribble, R. E.
Rok vydání: 2010
Předmět:
Zdroj: Phys.Rev.C82:035502,2010
Druh dokumentu: Working Paper
DOI: 10.1103/PhysRevC.82.035502
Popis: We have measured the half-life of the superallowed 0+ -to- 0+ beta+ emitter 26Si to be 2245.3(7) ms. We used pure sources of 26Si and employed a high-efficiency gas counter, which was sensitive to positrons from both this nuclide and its daughter 26mAl. The data were analyzed as a linked parent-daughter decay. To contribute meaningfully to any test of the unitarity of the Cabibbo-Kobayashi-Maskawa (CKM) matrix, the ft value of a superallowed transition must be determined to a precision of 0.1% or better. With a precision of 0.03% the present result is more than sufficient to be compatable with that requirement. Only the branching ratio now remains to be measured precisely before a +/-0.1% ft value can be obtained for the superallowed transition from 26Si.
Databáze: arXiv