Atomic resolution imaging at 2.5 GHz using near-field microwave microscopy

Autor:	Lee, Jonghee, Long, Christian J., Yang, Haitao, Xiang, Xiao-Dong, Takeuchi, Ichiro
Rok vydání:	2010
Předmět:	Condensed Matter - Mesoscale and Nanoscale Physics Condensed Matter - Materials Science
Zdroj:	Appl.Phys.Lett. 97, 183111 (2010)
Druh dokumentu:	Working Paper
DOI:	10.1063/1.3514243
Popis:	Atomic resolution imaging is demonstrated using a hybrid scanning tunneling/near-field microwave microscope (microwave-STM). The microwave channels of the microscope correspond to the resonant frequency and quality factor of a coaxial microwave resonator, which is built in to the STM scan head and coupled to the probe tip. We find that when the tip-sample distance is within the tunneling regime, we obtain atomic resolution images using the microwave channels of the microwave-STM. We attribute the atomic contrast in the microwave channels to GHz frequency current through the tip-sample tunnel junction. Images of the surfaces of HOPG and Au(111) are presented. Comment: 9 pages, 5 figures, submitted to Applied Physics Letters
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1007.0750 Zobrazit plný text záznamu View this record from Arxiv