The Effect of Electrostatic Screening on a Nanometer Scale Electrometer

Autor:	MacLean, Kenneth, Mentzel, Tamar S., Kastner, Marc A.
Rok vydání:	2010
Předmět:	Condensed Matter - Mesoscale and Nanoscale Physics
Druh dokumentu:	Working Paper
DOI:	10.1021/nl102121e
Popis:	We investigate the effect of electrostatic screening on a nanoscale silicon MOSFET electrometer. We find that screening by the lightly doped p-type substrate, on which the MOSFET is fabricated, significantly affects the sensitivity of the device. We are able to tune the rate and magnitude of the screening effect by varying the temperature and the voltages applied to the device, respectively. We show that despite this screening effect, the electrometer is still very sensitive to its electrostatic environment, even at room temperature. Comment: 5 pages, 4 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1006.5948 Zobrazit plný text záznamu View this record from Arxiv