Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray micro-diffraction

Autor:	Malachias, A., Deneke, Ch., Krause, B., Mocuta, C., Kiravittaya, S., Metzger, T. H., Schmidt, O. G.
Rok vydání:	2008
Předmět:	Condensed Matter - Materials Science
Druh dokumentu:	Working Paper
DOI:	10.1103/PhysRevB.79.035301
Popis:	We depict the use of x-ray diffraction as a tool to directly probe the strain status in rolled-up semiconductor tubes. By employing continuum elasticity theory and a simple model we are able to simulate quantitatively the strain relaxation in perfect crystalline III-V semiconductor bi- and multilayers as well as in rolled-up layers with dislocations. The reduction in the local elastic energy is evaluated for each case. Limitations of the technique and theoretical model are discussed in detail. Comment: 32 pages (single column), 9 figures, 39 references
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/0809.1253 Zobrazit plný text záznamu View this record from Arxiv