Role of Charge Traps in the Performance of Atomically Thin Transistors
| Autor: | Iddo Amit, Tobias J. Octon, Nicola J. Townsend, Francesco Reale, C. David Wright, Cecilia Mattevi, Monica F. Craciun, Saverio Russo |
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| Rok vydání: | 2017 |
| Zdroj: | Advanced Materials |
| ISSN: | 0935-9648 |
| DOI: | 10.1002/adma.201605598 |
| Databáze: | OpenAIRE |
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