5 7 5 line defects on As Si 100 A general stress relief mechanism for V IV surfaces

Autor: McMahon, W.E., Batyrev, I.G., Hannappel, T., Olson, J.M., Zhang, S.B.
Rok vydání: 2006
Předmět:
Popis: An entire family of nano scale trenches, ridges, and steps has been observed experimentally on AsH3 exposed Si 100 . Some of these line structures have been observed previously, but their structures have remained a mystery. Theoretical modeling shows that they are all based upon the same stress relieving 5 7 5 core structure. The strong similarities between line structures on As Si 100 , P Si 100 , As Ge 100 , and other V IV surfaces lead to a much broader conclusion 5 7 5 line structures are a general form of stress relief for group V terminated Si and Ge surfaces
Databáze: OpenAIRE