Spectral ellipsometry of nickel oxide films

Autor:	Rui, Z.
Rok vydání:	2022
Předmět:	thin films spectral ellipsometry nickel oxide optical constants оксид никеля спектральная эллипсометрия
Popis:	Nickel oxide (NiO) is used to create photovoltaic solar cells, which has unique optical and electrical properties, as well as good chemical stability. It is necessary to develop technological regimes for obtaining thin NiO films with optimal characteristics for their use in photovoltaics.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od______3041::a1af0b0bc026dbee1a51f813fcb76168 https://rep.vsu.by/handle/123456789/35828 Zobrazit plný text záznamu