Growth of thin Bi films on W(1 1 0)

Autor: Koitzsch, Christian, Bovet, M., Clerc, Florian, Naumovic, D., Schlapbach, Louis, Aebi, Philipp
Jazyk: angličtina
Rok vydání: 2008
Popis: We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar splitting of spots. It is shown that a preferential domain alignment along the [0 0 1]tungsten-direction accounts for this observation and is in agreement with a two-fold XPD pattern.
Databáze: OpenAIRE