Enhanced spin polarization of amorphous F ex S i1-x thin films revealed by Andreev reflection spectroscopy

Autor:	Karel, J, Bouma, DS, Martinez, J, Zhang, YN, Gifford, JA, Zhang, J, Zhao, GJ, Kim, DR, Li, BC, Huang, ZY, Wu, RQ, Chen, TY, Hellman, F
Rok vydání:	2018
Zdroj:	Physical Review Materials, vol 2, iss 6
Popis:	Point contact Andreev reflection spectroscopy has been utilized to determine the spin polarization of both amorphous and crystalline FexSi1-x (0.58
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od_______325::e3d6cbb858fec8413de2f74de7655c68 https://escholarship.org/uc/item/2h23x8kj Zobrazit plný text záznamu