| Autor: |
Kwon, Hyuk Joo, Harris-Jones, Jenah, Ranganath, Teki, Jindal, Vibhu, Chan, David, Goodwin, Frank, Rastegar, Abbas, Kearney, Patrick, Huh, Sungmin, Kishimoto, Masahiro, Nakajima, Toshio, Mochi, Iacopo, Goldberg, Kenneth A. |
| Jazyk: |
angličtina |
| Rok vydání: |
2010 |
| Zdroj: |
Kwon, Hyuk Joo; Harris-Jones, Jenah; Ranganath, Teki; Jindal, Vibhu; Chan, David; Goodwin, Frank; et al.(2010). Native blank defect analysis for the study of printability. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/7t6482f8 |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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