A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC
| Autor: | Fabricio Alcalde Bessia, Troy England, Hongzhi Sun, Leandro Stefanazzi, Davide Braga, Miguel Sofo Haro, Shaorui Li, Juan Estrada, Farah Fahim |
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| Rok vydání: | 2023 |
| Předmět: | |
| Zdroj: | IEEE Transactions on Circuits and Systems I: Regular Papers. 70:2306-2316 |
| ISSN: | 1558-0806 1549-8328 |
| DOI: | 10.1109/tcsi.2023.3256860 |
| Popis: | The \emph{MIDNA} application specific integrated circuit (ASIC) is a skipper-CCD readout chip fabricated in a 65 nm LP-CMOS process that is capable of working at cryogenic temperatures. The chip integrates four front-end channels that process the skipper-CCD signal and performs differential averaging using a dual slope integration (DSI) circuit. Each readout channel contains a pre-amplifier, a DC restorer, and a dual-slope integrator with chopping capability. The integrator chopping is a key system design element in order to mitigate the effect of low-frequency noise produced by the integrator itself, and it is not often required with standard CCDs. Each channel consumes 4.5 mW of power, occupies 0.156 mm${^2}$ area and has an input referred noise of 2.7${\mu\nu}_{rms}$. It is demonstrated experimentally to achieve sub-electron noise when coupled with a skipper-CCD by means of averaging samples of each pixel. Sub-electron noise is shown in three different acquisition approaches. The signal range is 6000 electrons. The readout system achieves 0.2${e^{-}}$ RMS by averaging 1000 samples with MIDNA both at room temperature and at 180 Kelvin. |
| Databáze: | OpenAIRE |
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