XAFS and X-MCD spectroscopies with undulator gap scan

Autor:	P. Elleaume, Andrei Rogalev, V. Gotte, Joel Chavanne, Christophe Gauthier, José Goulon
Rok vydání:	1997
Předmět:	Physics Nuclear and High Energy Physics Radiation Absorption spectroscopy Photon statistics Extended X-ray absorption fine structure business.industry Analytical chemistry Undulator Polarization (waves) X-ray absorption fine structure Optics business Instrumentation
Zdroj:	Journal of synchrotron radiation. 5(Pt 3)
ISSN:	0909-0495
Popis:	The first experimental applications of the undulator gap-scan technique in X-ray absorption spectroscopy are reported. The key advantage of this method is that during EXAFS scans the undulator is permanently tuned to the maximum of its emission peak in order to maximize the photon statistics. In X-MCD or spin-polarized EXAFS studies with a helical undulator of the Helios type, the polarization rate can also be kept almost constant over a wide energy range.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efa495a8f88e74a054cd01c748821f65 https://pubmed.ncbi.nlm.nih.gov/15263721 Zobrazit plný text záznamu