Hardness assurance levels and requirements for single event effects testing of integrated circuits
| Autor: | Alexey O. Ahmetov, Anatoly A. Smolin, Vladimir F. Gerasimov, A.V. Ulanova, A.V. Sogoyan, Vitaly V. Khaustov, Evgeny V. Churilin, Nikolai V. Ryasnoy, Alexander A. Sashov, Dmitry V. Boychenko, Andrey V. Yanenko, D. V. Bobrovsky, Konstantin A. Chumakov, Alexander I. Chumakov |
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| Rok vydání: | 2020 |
| Předmět: |
single event effects
hardness assurance levels test requirements Physics lcsh:T58.5-58.64 Spacecraft Basis (linear algebra) lcsh:Information technology business.industry Isotropy General Medicine Integrated circuit Topology lcsh:Q350-390 law.invention law lcsh:Information theory Geostationary orbit business Event (particle physics) Energy (signal processing) Electronic circuit |
| Zdroj: | Bezopasnostʹ Informacionnyh Tehnologij, Vol 27, Iss 1, Pp 83-97 (2020) |
| ISSN: | 2074-7136 2074-7128 |
| Popis: | The paper presents an analysis of existing approaches to estimation of single event rate (SER) in integrated circuits under effects of charged particles of space radiation environment. These issues are of significant importance in the light of the expansion of the scope of practical application of cyber-physical control systems for space objects, since it is mainly due to the SER that information is lost in the register elements and in the memory cells of the electronic blocks of spacecraft. It is shown that existing models based on energy deposition in fixed sensitive volume are not applicable for SER estimations in case of high threshold linear energy transfer (LET) values. An alternative approach is proposed. It is based on diffusion charge collection model, which can be used to estimate the SER cross-sections in isotropic particle field. A universal dependence for SER estimation in integral circuits (ICs) at geostationary orbit is proposed and used as a basis for establishing classification of devices based on hardness assurance levels. The obtained results provide the grounds for setting test requirements that has to be met during single event effects testing of ICs. |
| Databáze: | OpenAIRE |
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