Fabrication of soft gold microelectrode arrays as probes for scanning electrochemical microscopy
| Autor: | Ingo Wirth, Andreas Lesch, Frank Meiners, Gunther Wittstock, Hubert H. Girault, Ushula M. Tefashe, Fernando Cortés-Salazar, Britta Vaske, Dmitry Momotenko |
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| Přispěvatelé: | Publica, Lesch, Andrea, Momotenko, Dmitry, Cortés-Salazar, Fernando, Wirth, Ingo, Tefashe, Ushula Mengesha, Meiners, Frank, Vaske, Britta, Girault, Hubert H., Wittstock, Gunther |
| Rok vydání: | 2012 |
| Předmět: |
Gold electrode
Design General Chemical Engineering Nanotechnology Ag 02 engineering and technology Substrate (printing) engineering.material 010402 general chemistry 01 natural sciences Analytical Chemistry Diffusion Scanning electrochemical microscopy Coating Flexible electrodes Electrochemistry Chemical Engineering (all) Thin film Secm Electrodes Microelectrode array Non-contact printing Catalysts Flexible electrode Chemistry Gold electrodes Multielectrode array 021001 nanoscience & nanotechnology Parallel 0104 chemical sciences Kapton Microelectrode Tip Electrode engineering Mode Afm 0210 nano-technology |
| Zdroj: | Journal of Electroanalytical Chemistry |
| DOI: | 10.1016/j.jelechem.2011.12.005 |
| Popis: | Soft linear gold microelectrode arrays for high throughput scanning electrochemical microscopy (SECM) imaging were fabricated using the Aerosol Jet (R) printing technology. Nanoparticulate gold ink was printed on polyimide Kapton HN (R) thin films. After sintering, a 200 nm thick Parylene C coating was deposited to cover and seal the gold tracks. A cross-section of the array of microelectrodes was exposed by laser cutting using an ArF excimer laser beam directed onto a metallic mask. Cyclic voltammograms, approach curves and SECM images in feedback mode demonstrate the capability of the arrays as SECM probes. Reactivity imaging of a platinum band structure on glass was performed with Parylene C coating facing the substrate providing an almost constant working distance. The softness of the array leads to a bending and allows scanning in contact mode like brushing the sample surface. For hard surfaces such as array electrode structures and similar materials, this occurs without detectable damage to the sample. (C) 2011 Elsevier B.V. All rights reserved. |
| Databáze: | OpenAIRE |
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