Preparation and Loading Process of Single Crystalline Samples into a Gas Environmental Cell Holder for In Situ Atomic Resolution Scanning Transmission Electron Microscopic Observation
| Autor: | Kerstin Volz, Andreas Beyer, Rainer Straubinger |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
In situ Materials science Zone axis Sample (material) Analytical chemistry chemistry.chemical_element 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Focused ion beam Nitrogen chemistry Transmission (telecommunications) Atomic resolution Scientific method 0103 physical sciences 0210 nano-technology Instrumentation |
| Zdroj: | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 22(3) |
| ISSN: | 1435-8115 |
| Popis: | A reproducible way to transfer a single crystalline sample into a gas environmental cell holder for in situ transmission electron microscopic (TEM) analysis is shown in this study. As in situ holders have only single-tilt capability, it is necessary to prepare the sample precisely along a specific zone axis. This can be achieved by a very accurate focused ion beam lift-out preparation. We show a step-by-step procedure to prepare the sample and transfer it into the gas environmental cell. The sample material is a GaP/Ga(NAsP)/GaP multi-quantum well structure on Si. Scanning TEM observations prove that it is possible to achieve atomic resolution at very high temperatures in a nitrogen environment of 100,000 Pa. |
| Databáze: | OpenAIRE |
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