New Design Methodology – Using VHDL-AMS Models to Consider Aging Effects in Automotive Mechatronic Circuits for Safety Relevant Functions
| Autor: | Ludek Elis, Gerhard Hofmann, Georg Scharfenberg |
|---|---|
| Přispěvatelé: | Pinker, Jiří |
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Computer science
funkční bezpečnost media_common.quotation_subject Automotive industry 02 engineering and technology mechatronic design method 01 natural sciences VHDL 0202 electrical engineering electronic engineering information engineering VHDL-AMS Design methods Function (engineering) computer.programming_language media_common resistor aging Functional safety business.industry 020208 electrical & electronic engineering 010401 analytical chemistry functional safety Mechatronics 0104 chemical sciences Reliability engineering stárnutí rezistoru Design process business metoda mechatronického návrhu computer |
| Popis: | In this paper a design method for mechatronic functions in an early design phase under consideration of the requirements of functional safety is proposed [14]. The goal of the method is to discover threats for the safety goals and to prove or optimize the diagnostic mechanisms. At the current design process a lifetime endurance test is performed in a late project phase. In order to avoid unexpected late design changes the method should be applied in an early design phase. The method is an additional way to avoid design failures for E/E functions with special focus on aging in the field of functional safety applications. The method is developed out of three standards VDI 2221 methodology for development and construction of technical systems and products [1]), VDI 2206 design methodology for mechatronic systems [2] and the ISO 26262 road vehicles - Functional Safety [3] by using the V-Model. Furthermore, a core element of the design method is simulating aging effects by applying VHDL – AMS. To demonstrate the design methodology a sensor out of the EGAS function is chosen as a safety relevant automotive system. The limitation is the availability of aging data for electrical components.i |
| Databáze: | OpenAIRE |
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