Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors
| Autor: | Ainhoa Galarza, Piero Baraldi, Daniel Astigarraga, J. M. Echeverria, Enrico Zio, Federico Martin Ibanez, Inigo Unanue |
|---|---|
| Přispěvatelé: | Dipartimento di Energia [Milano] (DENG), Politecnico di Milano [Milan] (POLIMI), Chaire Sciences des Systèmes et Défis Energétiques EDF/ECP/Supélec (SSEC), Ecole Centrale Paris-SUPELEC-CentraleSupélec-EDF R&D (EDF R&D), EDF (EDF)-EDF (EDF), Laboratoire Génie Industriel - EA 2606 (LGI), CentraleSupélec, European Project: 314609,EC:FP7:ICT,FP7-2012-ICT-GC,HEMIS(2012), Ecole Centrale Paris-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-CentraleSupélec-EDF R&D (EDF R&D), Dipartimento di Energia [Milano] |
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Engineering
Powertrain PHM 02 engineering and technology 7. Clean energy 01 natural sciences IGBT [SPI]Engineering Sciences [physics] Reliability (semiconductor) 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering ComputingMilieux_MISCELLANEOUS 010302 applied physics Accelerated Aging Tests business.industry 020208 electrical & electronic engineering Bipolar junction transistor Electrical engineering Insulated-gate bipolar transistor FEV Accelerated aging Reliability engineering Logic gate visual_art Electronic component visual_art.visual_art_medium business Voltage |
| Zdroj: | IEEE Transactions on Power Electronics IEEE Transactions on Power Electronics, Institute of Electrical and Electronics Engineers, 2016, 31 (11), pp.7953-7962. ⟨10.1109/TPEL.2015.2512923⟩ IEEE Transactions on Power Electronics, 2016, 31 (11), pp.7953-7962. ⟨10.1109/TPEL.2015.2512923⟩ |
| ISSN: | 0885-8993 |
| DOI: | 10.1109/TPEL.2015.2512923⟩ |
| Popis: | The introduction of fully electric vehicles (FEVs) into the mainstream has raised concerns about the reliability of their electronic components such as IGBT. The great variability in IGBT failure times caused by the very different operating conditions experienced and the stochasticity of their degradation processes suggests the adoption of condition-based maintenance approaches. Thus, the development of methods for assessing their healthy state and predicting their remaining useful life (RUL) is of key importance. In this paper, we investigate the results of performing accelerated aging tests. Our objective is to discuss the design and the results of accelerated aging tests performed on three different IGBT types within the electrical powertrain health monitoring for increased safety (HEMIS) of FEVs European Community project. During the tests, several electric signals were measured in different operating conditions. The results show that the case temperature $(T_{C})$ , the collector current $(I_{C})$ , and the collector–emitter voltage $(V_{{\rm CE}})$ are the failure precursor parameters that can be used for the development of a prognostic and health monitoring (PHM) system for FEV IGBTs and other medium-power switching supplies. |
| Databáze: | OpenAIRE |
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