Performance of a cryogenic silicon monochromator under extreme heat load
| Autor: | Wah-Keat Lee, Rudolf Rüffer, Keith Martel, Jean-Philippe Celse, Michel Rossat, Aleksandr I. Chumakov, Olaf Leupold |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Silicon
Nuclear and High Energy Physics Hot Temperature Materials science Transducers chemistry.chemical_element Flux law.invention Crystal Extreme heat Optics law Freezing Instrumentation Monochromator Range (particle radiation) Radiation business.industry X-Rays Spectral density Equipment Failure Analysis chemistry business Synchrotrons Beam (structure) |
| Zdroj: | Journal of Synchrotron Radiation. 11:132-141 |
| ISSN: | 0909-0495 |
| DOI: | 10.1107/s0909049503026785 |
| Popis: | The performance of an indirectly cooled cryogenic silicon monochromator under heat loads up to 870 W has been studied. The investigation was performed over numerous parameters and included measurements of total flux, spectral density, rocking curves, angular beam profiles and crystal slope errors. An almost ideal monochromator performance was observed in the 270-570 W range of the heating power. At a heat load of approximately 400 W and under standard operation conditions, the crystal distortions did not exceed 1 micro rad. At the highest available heat load of 870 W, the crystal distortions were about 7 micro rad. |
| Databáze: | OpenAIRE |
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