Conduction properties and threshold voltage instability in β-Ga2O3 MOSFETs

Autor:	Manuel Fregolent, Enrico Brusaterra, Carlo De Santi, Kornelius Tetzner, Joachim Würfl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Rok vydání:	2022
Předmět:	gate current Inhibition Model Gallium Oxide Trapping Threshold voltage instability
Zdroj:	Oxide-based Materials and Devices XIII.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d88a5d67d25b45bfcc1f46b0e54d1b08 https://doi.org/10.1117/12.2607362 Zobrazit plný text záznamu