Effects of modelling detail on simulated potential crop yields under a wide range of climatic conditions
Autor: | Frank Ewert, H. van Keulen, Myriam Adam, L.G.J. van Bussel, Peter A. Leffelaar |
---|---|
Přispěvatelé: | Fonctionnement et conduite des Systèmes de culture Tropicaux et Méditerranéens, Centre de Coopération Internationale en Recherche Agronomique pour le Développement (Cirad)-Institut National de la Recherche Agronomique (INRA)-Institut national d’études supérieures agronomiques de Montpellier (Montpellier SupAgro), Institut national d'enseignement supérieur pour l'agriculture, l'alimentation et l'environnement (Institut Agro)-Institut national d'enseignement supérieur pour l'agriculture, l'alimentation et l'environnement (Institut Agro), Plant Production Systems Group, Wageningen University and Research [Wageningen] (WUR), Plant Research International (PRI), Netherlands Environmental Assessment Agency, Wageningen University and Research Centre (WUR), Rheinische Friedrich-Wilhelms-Universität Bonn |
Jazyk: | angličtina |
Rok vydání: | 2011 |
Předmět: |
0106 biological sciences
climatic variability air co2 enrichment leaf senescence Atmospheric sciences 01 natural sciences crop growth model light interception growth simulation light-use efficiency Range (statistics) Sensitivity (control systems) Leaf area index 2. Zero hunger carbon balance Biomass (ecology) elevated co2 leaf area index radiation use efficiency Ecology Ecological Modeling Crop yield 04 agricultural and veterinary sciences indice foliaire (LA!) 15. Life on land sénescence des feuilles PE&RC model complexity PPO/PRI AGRO Duurzame Bedrijfssystemen spring wheat Plant Production Systems terrestrial biosphere 13. Climate action stomatal conductance Plantaardige Productiesystemen 040103 agronomy & agriculture 0401 agriculture forestry and fisheries Environmental science complexité du modèle Interception Crop simulation model [SDE.BE]Environmental Sciences/Biodiversity and Ecology leaf-area index Level of detail 010606 plant biology & botany |
Zdroj: | Ecological Modelling Ecological Modelling, Elsevier, 2011, 222 (1), pp.131-143. ⟨10.1016/j.ecolmodel.2010.09.001⟩ Ecological Modelling, 222(1), 131-143 Ecological Modelling 222 (2011) 1 |
ISSN: | 0304-3800 |
DOI: | 10.1016/j.ecolmodel.2010.09.001 |
Popis: | Contact: Office.PP@wur.nl; International audience; Crop simulation models are widely applied at large scale for climate change impact assessment or integrated assessment studies. However, often a mismatch exists between data availability and the level of detail in the model used. Good modelling practice dictates to keep models as simple as possible, but enough detail should be incorporated to capture the major processes that determine the system's behaviour. The objective of this study was to investigate the effect of the level of detail incorporated in process-based crop growth models on simulated potential yields under a wide range of climatic conditions. We conducted a multi-site analysis and identified that by using a constant radiation use efficiency (RUE) value under a wide range of climatic conditions, the description of the process of biomass production may be over-simplified, as the effects of high temperatures and high radiation intensities on this parameter are ignored. Further, we found that particular attention should be given to the choice of the light interception approach in a crop model as determined by leaf area index (LA!) dynamics. The two LAI dynamics approaches considered in this study gave different simulated yields irrespective of the characteristics of the location and the light interception approaches better explained the differences in yield sensitivity to climatic variability than the biomass production approaches. Further analysis showed that differences between the two IAI dynamics approaches for simulated yields were mainly due to different representations of leaf senescence in both approaches. We concluded that a better understanding and modelling of leaf senescence, particularly its onset, is needed to reduce model uncertainty in yield simulations. |
Databáze: | OpenAIRE |
Externí odkaz: |