Electronic Characteristics of Ultra‐Thin Passivation Layers for Silicon Photovoltaics

Autor: Sophie L. Pain, Edris Khorani, Tim Niewelt, Ailish Wratten, Galo J. Paez Fajardo, Ben P. Winfield, Ruy S. Bonilla, Marc Walker, Louis F. J. Piper, Nicholas E. Grant, John D. Murphy
Přispěvatelé: Publica
Rok vydání: 2022
Předmět:
Zdroj: Advanced Materials Interfaces. 9:2201339
ISSN: 2196-7350
Popis: Surface passivating thin films are crucial for limiting the electrical losses during charge carrier collection in silicon photovoltaic devices. Certain dielectric coatings of more than 10 nm provide excellent surface passivation, and ultra-thin (
Databáze: OpenAIRE