Influence of Power Cycling Test Methodology on the Applicability of the Linear Damage Accumulation Rule for the Lifetime Estimation in Power Devices

Autor:	Alessandro Vaccaro, Paolo Magnone
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Power Electronics. 38:6545-6554
ISSN:	1941-0107 0885-8993
DOI:	10.1109/tpel.2023.3242314
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c65c783db85964c2271e47d6f99535ea https://doi.org/10.1109/tpel.2023.3242314 Zobrazit plný text záznamu