High Reliability and Performance Poly-Si TFTs for System in Displays

Autor:	Mieko Matsumura, Mutsuko Hatano, Hirotaka Hamamura, Makoto Ohkura, Toshio Miyazawa, Yoshiaki Toyota, Mitsuharu Tai
Rok vydání:	2006
Předmět:	Computer science Hardware_INTEGRATEDCIRCUITS Hardware_PERFORMANCEANDRELIABILITY Reliability (statistics) Reliability engineering
Zdroj:	ECS Transactions. 3:35-41
ISSN:	1938-6737 1938-5862
Popis:	Narrow frame size IPS-mode LCD with high resolution system-in- display have been developed utilizing hybrid laser crystallization technology: SELAX are applied to low-power, high-speed circuits, and conventional ELC are used for the high- voltage circuits. The TFT degradation phenomena under dynamic stress are clarified, and the high-immunity TFT structure and high-quality gate insulator are proposed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c6213fb6e8db95e5b5c1382ce6ec64a0 https://doi.org/10.1149/1.2356332 Zobrazit plný text záznamu